Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2001-11-29
2003-11-25
Le, N. (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S754090, C324S762010
Reexamination Certificate
active
06653825
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to meter lead holders, and, more particularly, to those holders that have arms connectible to a probe. The arms may move in different planes relative to a base, an arm securing means and each other. The meter lead holder may include a probe which is spring loaded so that pressure of the probe connector against a meter or a terminal mechanically keeps the probe in place. In addition, the meter lead holder may include a spring loaded housing for a probe that is located partially within the housing.
2. Information Disclosure Statement
There are many patents related to probe holders. The following is representative of the art:
U.S. Pat. No. 6,285,180 to Pas discloses an apparatus for precisely positioning and thereafter holding a probe connected to an oscilloscope or the like. The apparatus enables a single operator to position the probe and read and adjust the oscilloscope. The apparatus has a rod like means about which a nonconducting probe holder enjoys several degrees of freedom. The rod is connected to a weighted base by a clamp through which the rod may slide as part of the gross positioning of the assembly and which clamp can be adjusted to finely position the rod and probe clamp assembly.
U.S. Pat. No. 6,261,231 relates to an apparatus for holding a probe and a method for using the same. The apparatus comprises a body portion having a longitudinal bore and a membrane holder positioned over a first end of a body portion. The membrane holder defines an opening which is covered by a membrane. A receptacle for receiving the probe is rotatably positioned within the longitudinal bore of the body portion at a second end of the body portion. The membrane, membrane holder, body portion, receptacle, and probe define a sealed chamber for containing a contacting medium.
U.S. Pat. No. 6,248,101 to Whitmore, III et al. describes and illustrates an apparatus for supporting and facilitating accurate positioning, both linearly and angularly of a medical device such as and ultrasound probe, a medical instrument or an imaging device. The apparatus is capable of both gross and precise multidirectional movements with the medical device attached, while remaining connected to stationary objects such as a portable floor stand and/or operating table. After gross manual placement and approximate positioning, the fine tune mechanism of the attached medical device is locked in position and secured to two fixed points. Exact positioning is then achieved by the precision movements which are available in all three linear directions and rotational axes. By this arrangement which allows preattachment of the medical device or instrument (i.e., an ultrasound probe) to the apparatus prior to positioning in the patient, quicker, more accurate and more reproducible medical device positioning and placement are achieved. In one preferred embodiment, the apparatus provides for multidirectional adjustment including a plurality of translational and one rotational adjustment.
U.S. Pat. No. 6,126,636 relates to a method and device for accurately positioning a measuring means such as a measurement probe relative to that target area of a living body which has a unique marking peculiar to the living body. A transparent sheet member is first applied to the target part, and an image of the unique marking is then transferred onto the transparent sheet member. The transparent sheet member bearing the image of the unique marking is associated with the measuring device so that a subsequent measurement can be performed by the measuring device after the image transferred onto the transparent sheet member has been aligned with the unique marking in the target area.
U.S. Pat. No. 6,124,723 to Costello relates to a probe holder for a wafer probe station. It is comprised of a pair of over-and-under rigid extensions, one of which receives the probe shank. The other is connected to the probe to make a Kelvin connection. The two coaxial extensions are supported by a vertical tube which contains a pair of coaxial cables connected to triaxial cables outside of the probe station enclosure.
U.S. Pat. No. 6,031,383 describes and illustrates a probe station having probe manipulators with probe supports disposed around a cover assembly with an inspection opening. Each probe support has a vertical tube extending through an opening in the cover assembly and a horizontal adjustable member extending radially inwardly and supporting a probe holder. Each such horizontal member may be angularly and longitudinally adjusted with respect to its vertical tube. Pairs of coaxial guarding cables run inside the vertical tubes and make Kelvin connections to the probe holders.
U.S. Pat. No. 4,908,568 to Soelkner discloses a mechanical probe for optical measurement of electrical potentials. The probe of the present invention is composed of a cubic, electro-optical crystal fashioned in the form of a tip and of a metallization which is at ground potential and which covers the crystal with the exception of those surface regions located immediately opposite a measuring location, for example an interconnect of an integrated circuit. Since the metallization acting as a cooperating electrode significantly facilitates the penetration if the electrical stray field into the crystal tip, geometry-dependent effects and influences of electrical microfields are nearly completely suppressed. The probe therefore makes it possible to utilize the voltage difference for optical measurement of electrical signals with high chronological resolution.
U.S. Pat. No. 4,857,836 relates to a mechanical probe for optical measurement of electrical signals. The probe for optical measurement of electrical signals with high chronological resolution is composed of a cuboid electro-optical crystal, of a co-planar waveguide structure located on a lateral face of the crystal and of a metallic tip applied to the end face of the crystal adjacent a measuring location. The signal at the measuring location, for example at an interconnect of an integrated circuit is taken with the metallic tip and is fed into the co-planar waveguide structure composed of two strip-shaped metallizations. Probe is holders or electrostrictive manipulators known in the art of electrical metrology (probe measuring location) can be used for exact positioning of the probe onto the measuring location.
U.S. Pat. No. 4,343,092 discloses a probe guide for holding a coating thickness measurement probe in contact with a coated workpiece such that repeatable thickness measurements may be made without the necessity of the user manually positioning the probe head for proper contact. The probe guide having a probe holding assembly constructed to permit the probe to swivel freely in any direction about the geometric center of the probe head face. A workpiece holding means is provided for holding the workpiece against a probe head of the probe. By positioning the workpiece holding means for forcibly move the workpiece into contact with the probe head face, the probe will swivel until the resultant vector through the center of movement of the static forces through the workpiece acting on the probe head at the point or points of the probe head passes through the geometric center of the probe head face. With this construction, repeatable thickness measurements may be made and the probe may be used to measure coatings on workpieces which have complex shapes such as jewelry items and turbine blades.
U.S. Pat. No. 4,305,207 to Lantz describes and illustrates a three-axis coordinate inspection machine. A pair of parallel Z axis rails are mounted atop a bearing plate having an upwardly facing horizontal bearing surface. A single X axis rail has opposite ends slidably and bearingly mounted to the Z axis rail. The X axis rail extends through a carrier which is supported by the bearing surface of the bearing plate. A vertically extending column is mounted to the carrier and slidably holds in the vertical direction one or more inspection probes which may in turn be
Glynn, Esq. Kenneth P.
Teresinski John
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