Metals compatible post-etch photoresist remover and/or...

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...

Reexamination Certificate

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C510S176000, C134S001300

Reexamination Certificate

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08058219

ABSTRACT:
A liquid removal composition and process for removing photoresist and/or sacrificial anti-reflective coating (SARC) material from a microelectronic device having same thereon. The liquid removal composition includes at least one organic quaternary base and at least one surface interaction enhancing additive. The composition achieves at least partial removal of photoresist and/or SARC material in the manufacture of integrated circuitry with minimal etching of metal species on the microelectronic device, such as copper and cobalt, and without damage to low-k dielectric materials employed in the microelectronic device architecture.

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patent: 6551973 (2003-04-01), Moore
patent: 6599370 (2003-07-01), Skee
patent: 6752878 (2004-06-01), Montano et al.
patent: 2002/0072482 (2002-06-01), Sachdev et al.
patent: 2004/0180300 (2004-09-01), Minsek et al.
patent: 2005/0197265 (2005-09-01), Rath et al.
patent: 1128221 (2001-08-01), None
patent: 0213242 (2002-02-01), None
patent: 2004059700 (2004-07-01), None
patent: 2006074316 (2006-07-01), None
European Patent Office, Supplemental European Search Report, Dec. 5, 2008.

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