Metallographic microscope useful for the characterization of con

Details Metallographic microscope useful for the characterization of con Metallographic microscope useful for the characterization of con

1994-07-26

1995-10-10

Ben, Loha

Optical: systems and elements

Compound lens system

Microscope

359368, 359385, G02B 2106

Patent

active

054575710

ABSTRACT:
A metallographic microscope for characterizing conductor drawing dies having a light collimating system, linear scales for horizontal and vertical axis of the platina, a positioning device on the platina, an electronic closed loop circuit for controlling the illumination through the collimating system, and a power supply and internal cabling within the body of the microscope for a video camera mounted to the lens system.

REFERENCES:
patent: 977842 (1910-12-01), Sauveur
patent: 3551019 (1970-12-01), Michel
patent: 3633991 (1972-01-01), Miller
patent: 3721759 (1973-03-01), Lang
patent: 4285568 (1981-08-01), Elgart
patent: 4555620 (1985-11-01), Bridson et al.
patent: 4711537 (1987-12-01), Schindl et al.
patent: 4784481 (1988-11-01), Wuerfel
patent: 4958920 (1990-09-01), Jorgens et al.

Affiliated with

Also associated with

Rating

Metallographic microscope useful for the characterization of con does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metallographic microscope useful for the characterization of con, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallographic microscope useful for the characterization of con will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2314384