Metallization processing

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437228, 437190, 437192, H01L 2148

Patent

active

049993178

ABSTRACT:
When forming a metallization layer in integrated-circuit semiconductor device fabrication, metal such as tungsten, for example, adheres poorly to a dielectric such as, e.g., silicon oxide, and tends to flake off from wafer areas not covered by a glue layer. Processing of the invention prevents such flaking by, first, removing the dielectric from the back side, edge, and "clip-mark" areas of the wafer and, second, depositing a glue layer on remaining dielectric on the face of the wafer. Removal of dielectric material is by etching in the presence of a protective layer on the face of the wafer.

REFERENCES:
patent: 4404235 (1983-09-01), Tarng et al.
patent: 4845050 (1989-07-01), Kim et al.
"Thin Film Processes", John Vossen; pp. 401-403, 408-409, 412-425, 1987.
"Thin Layers of TiN and Al as Glue Layers for Blanket Tungsten Deposition", 1987, Materials Research Society, pp. 187-195; Rana et al.
"Tungsten on Conducting Nitride Composite Film"; IBM Technical Disclosure Bulletin; Ahn et al., 8/88, pp. 477-478.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metallization processing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metallization processing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallization processing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-448476

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.