Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1984-09-11
1990-07-24
Childs, Sadie
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427 10, 427250, B05D 312
Patent
active
049434462
ABSTRACT:
A method of metallizing a substrate by applying a metallic film to the substrate and measuring the film at a plurality of different lateral positions of the substrate by inducing an eddy current in the film and detecting the magnitude of the film to provide an indication of film thickness.
REFERENCES:
patent: 3086889 (1963-04-01), Strong
patent: 3576670 (1971-04-01), Hammond
patent: 4051270 (1977-09-01), Butler
Iles Roy A. H.
Isherwood Harold
Childs Sadie
Dennison Manufacturing Company
Josephs Barry D.
Kersey George E.
Moore Arthur B.
LandOfFree
Metallization of substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metallization of substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallization of substrates will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1267020