Metallization layer

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257754, 257762, 257764, 257774, H01L 2348

Patent

active

061440957

ABSTRACT:
An integrated circuit includes a metallization layer (30). A first layer (14) is formed outwardly from a semiconductor substrate (10). Contact vias (16) are formed through the first layer (14) to the semiconductor substrate (10). A second layer (20) is formed outwardly from the first layer (14). Portions of the second layer (20) are selectively removed such that the remaining portion of the second layer (20) defines the layout of the metallization layer (30) and the contact vias (16). The first and second layers (14) and (20) are electroplated by applying a bi-polar modulated voltage having a positive duty cycle and a negative duty cycle to the layers in a solution containing metal ions. The voltage and surface potentials are selected such that the metal ions are deposited on the remaining portions of the second layer (20). Further, metal ions deposited on the first layer (14) during a positive duty cycle are removed from the first layer (14) during a negative duty cycle. Finally, exposed portions of the firs layer (14) are selectively removed.

REFERENCES:
patent: 4884123 (1989-11-01), Dixit et al.
patent: 5243220 (1993-09-01), Shibata et al.
patent: 5277985 (1994-01-01), Li et al.
patent: 5310602 (1994-05-01), Li et al.
patent: 5317193 (1994-05-01), Watanabe
patent: 5381040 (1995-01-01), Sun et al.
patent: 5530418 (1996-06-01), Hsu et al.
patent: 5545926 (1996-08-01), Kohyama et al.
patent: 5691571 (1997-11-01), Hirose et al.
patent: 5719446 (1998-02-01), Taguchi et al.
patent: 5739579 (1998-04-01), Chiang et al.
patent: 5824599 (1998-10-01), Schacham-Diamond et al.
patent: 5851367 (1998-12-01), Nguyen et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metallization layer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metallization layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallization layer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1644123

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.