Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-03-13
1998-07-28
Noland, Thomas P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
738659, 269254R, 269903, G01R 3126
Patent
active
057867046
ABSTRACT:
A metallic tray unit for testing a semiconductor device is disclosed including: a unit body on the bottom having a cavity in which a semiconductor device for testing is placed; and fixing equipment for holding the semiconductor device in the cavity when the semiconductor device is moved to the lower part of the unit body. The unit body has rectangular openings, one of which is opened in the direction of the upper part of the cavity and another which is opened toward the cavity. The fixing equipment includes plate springs that are installed on side walls of the openings in parallel thereto. The plate springs are opened as the device is inserted into the cavity, and then are returned to their former condition after insertion of the device thereto, whereby their ends exposed to the cavity catch the device. In addition, each of the plate springs includes on the end exposed to the cavity a catching lug for holding both ends of the device; and a guiding lug formed faced to the catching lug to lead the movement of the plate spring.
REFERENCES:
patent: 3354394 (1967-11-01), James
patent: 3568263 (1971-03-01), Mechan
patent: 3963315 (1976-06-01), Bonis
patent: 4537059 (1985-08-01), Sokolovsky
patent: 5281320 (1994-01-01), Turner et al.
patent: 5384531 (1995-01-01), Yamazaki et al.
patent: 5422579 (1995-06-01), Yamaguchi
patent: 5444388 (1995-08-01), Ideta et al.
patent: 5528159 (1996-06-01), Charlton et al.
patent: 5539676 (1996-07-01), Yamaguchi
"Burn-In Method and Burn-In Board", Patent Abstracts of Japan; Grp P985, vol. 14, No. 1 Abs pub. date Jan. 8, 1990 (1-253663).
"Jig for Electrically Connecting Semiconductor Device"; Patent Adstracts of Japan; Grp P1018, vol. 14, No. 124 abs Pub date Mar. 8, 1990 (1-318977).
"Device for Testing Semiconductor Device"; Patent Abstracts of Japan; Grp E 1124, vol. 15, No. 412 Abs pub. date Oct. 21, 1991 (3-171646).
"Jig for Manufacturing Semiconductor and Testing Equipment Using that Jig"; Patent Abstracts of Japan (8-37225 dated Feb. 6, 1996).
Budzyn Ludomir A.
Casella Anthony J.
Hespos Gerald E.
Mirae Corporation
Noland Thomas P.
LandOfFree
Metallic tray unit for testing a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metallic tray unit for testing a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallic tray unit for testing a semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-25761