Telephonic communications – Diagnostic testing – malfunction indication – or electrical... – Testing of subscriber loop or terminal
Patent
1996-05-23
1999-07-06
Kuntz, Curtis A.
Telephonic communications
Diagnostic testing, malfunction indication, or electrical...
Testing of subscriber loop or terminal
379 5, 379 22, 379 27, 370244, 370250, H04M 124
Patent
active
059206098
ABSTRACT:
A metallic access test extension system architecture for a digital transmission system is provided. The digital transmission system includes a local end and a plurality of remote ends, each of said plurality of remote ends including a digital communication path and a metallic test pair connection. The local end includes a corresponding digital communication path and corresponding metallic pair connection. The architecture includes a remote unit coupled to each metallic test pair and digital communication path at each of said plurality of remote ends. The remote unit includes a metallic access test extension module. The architecture further includes a central office unit at the local end of the digital communication path, the local end unit including a metallic test extension module and a switch system, responsive to a control signal, for selectively connecting the digital communication paths and metallic test pairs at the local and to the metallic test extension module in the local end unit. In a second embodiment, the test system includes a POTS test system, a special services test system, a metallic test extension local end unit module and a metallic test extension remote unit module. Each remote unit is coupled to a metallic bypass pair line at the remote and to which the digital transmission system may connect any of a plurality of metallic pairs connecting to customers.
REFERENCES:
patent: 4424421 (1984-01-01), Townsend et al.
patent: 4961218 (1990-10-01), Kiko
patent: 5202919 (1993-04-01), Kiko
patent: 5457743 (1995-10-01), Kiko
patent: 5471517 (1995-11-01), Nakagawa
patent: 5473666 (1995-12-01), Szczebak et al.
patent: 5615225 (1997-03-01), Foster et al.
patent: 5764727 (1998-06-01), Toumani et al.
"Tollgrade MCU-4496, Issue 3B, List 1, SLF-96 Metallic Channel Unit for MLT (Digital By-Pass Pair)" data sheet, Tollgrade Communications Inc., Sep. 1993.
"Transmission DCU Turbo 2000," data sheet, Keptel, Inc.
Bauer Paul
Darnell Brad T.
Ruiz Marco
Toumani Rouben
Kuntz Curtis A.
Nguyen Duc
Wiltron Company
LandOfFree
Metallic access test extension system architecture does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metallic access test extension system architecture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallic access test extension system architecture will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-905230