Metallic access test extender

Details Metallic access test extender Metallic access test extender

1996-05-23

1998-06-09

Kuntz, Curtis

Telephonic communications

Diagnostic testing, malfunction indication, or electrical...

Testing of subscriber loop or terminal

379 29, 379 22, 379 5, 370244, 370250, H04M 124, H04J 116

Patent

active

057647275

ABSTRACT:
A metallic access test extender includes an office unit and a remote unit coupled to the office unit via a digital transmission system. A voltage controlled current source is included in the office unit and a voltage controlled voltage source in the remote unit. The voltage controlled current source is responsive to the voltage and current sensed at the remote unit load, and the voltage controlled voltage source is responsive to the voltage and current sensed at the input to the office unit. A shunt admittance which has a high impedance at DC and low frequencies is coupled to the office unit load.

REFERENCES:
patent: 4270030 (1981-05-01), Brolin et al.
patent: 4961218 (1990-10-01), Kiko
patent: 5054050 (1991-10-01), Bruke et al.
patent: 5111497 (1992-05-01), Bliven et al.
patent: 5202919 (1993-04-01), Kiko
patent: 5361293 (1994-11-01), Czerwiec
patent: 5457743 (1995-10-01), Kiko
"Tollgrade MCU-4496, Issue 3B, List 1, SLF-96 Metallic Channel Unit for MLT (Digital By-Pass Pair)" data sheet, Tollgrade Communications Inc., Sep. 1993.
"Transmission DCU Turbo 2000," data sheet, Keptel, Inc.

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