Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-12-14
1997-12-09
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
354401, G01B 1100
Patent
active
056965877
ABSTRACT:
Improved metal targets deposited on the surface of an IC chip for determining a reference coordinate in a laser repair apparatus for calculating the actual coordinates of a repair site in the shape of rectangular bars for occupying a smaller space on the surface of an integrated circuit chip and for enabling a simplified process for determining the actual coordinates.
REFERENCES:
patent: 5414519 (1995-05-01), Han
Evans F. L.
United Microelectronics Corporation
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