Metal-polishing liquid and chemical mechanical polishing...

Etching a substrate: processes – Nongaseous phase etching of substrate – Using film of etchant between a stationary surface and a...

Reexamination Certificate

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Details

C252S079100, C438S692000, C051S309000

Reexamination Certificate

active

07857985

ABSTRACT:
The invention provides a metal polishing liquid comprising an oxidizing agent and colloidal silica in which a part of a surface of the colloidal silica is covered with aluminum atoms, and a Chemical Mechanical Polishing method using the same. An amino acid, a compound having an isothiazoline-3-one skeleton, an organic acid, a passivated film forming agent, a cationic surfactant, a nonionic surfactant, and a water-soluble polymer may be contained. A metal polishing liquid which is used in Chemical Mechanical Polishing in manufacturing of a semiconductor device, attains low dishing of a subject to be polished, and can perform polishing excellent in in-plane uniformity of a surface to be polished.

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European Search Report issued in counterpart EP 07002005.2 dated Jul. 30, 2009.
Japanese Office Action issued in corresponding Japanese Application No. 2006-021511, dated Oct. 26, 2010.

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