Patent
1990-07-23
1991-08-27
Mintel, William
357 238, 357 20, H01L 2910, H01L 2968, H01L 2906
Patent
active
050437798
ABSTRACT:
An MOS device where the avalanche breakdown strength may be increased without decreasing the on-resistance of the device is provided by decreasing the width of a high impurity concentration area in contact with one of the two electrodes to increase the curvature of the deepest part of the well region.
REFERENCES:
patent: 4206469 (1980-06-01), Hanes et al.
patent: 4593302 (1986-06-01), Lidow et al.
patent: 4803532 (1989-02-01), Mihara
patent: 4821095 (1989-04-01), Temple
patent: 4965647 (1990-10-01), Takahashi
Fuji Electric & Co., Ltd.
Limanek Robert P.
Mintel William
LandOfFree
Metal oxide semiconductor device with well region does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metal oxide semiconductor device with well region, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal oxide semiconductor device with well region will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1417856