Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device
Reexamination Certificate
2006-08-01
2006-08-01
Fourson, George (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
C257SE29211, C257SE29216
Reexamination Certificate
active
07084438
ABSTRACT:
A semiconductor power component having an anode contact on the reverse side, an emitter region of a first conductor type on the reverse side, which is connected to the anode contact on the reverse side, a drift zone which is connected to the emitter region that is on the reverse side and extends partially to the front surface, an MOS control structure on the front side, having a control contact positioned in insulated fashion, a cathode contact on a front side which is connected to a source region and a first body region. The drift zone has first and second drift region of a second conductor type and a third drift region of first conductor type. First drift region is a buried region, second drift region connects the front surface to first drift region, and third drift region connects the first and/or second body region to first drift region. The degree of compensation (K(y)) that is ascertainable from the second and third drift region is greater than one and has a maximum in the region of the side of the third drift region facing away from the front surface.
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Feiler Wolfgang
Plikat Robert
Fourson George
Pham Thanh V.
Robert & Bosch GmbH
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