Metal-insulator-metal (MIM) switching devices

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Responsive to non-optical – non-electrical signal

Reexamination Certificate

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Details

C257S262000, C257S369000, C257SE29170, C335S155000, C361S233000

Reexamination Certificate

active

08044442

ABSTRACT:
A gated nano-electro-mechanical (NEM) switch employing metal-insulator-metal (MIM) technology and related devices and methods which can facilitate implementation of low-power, radiation-hardened, high-temperature electronic devices and circuits. In one example embodiment a gate electrode is configured as a cantilever beam whose free end is coupled to a MIM stack. The stack moves into bridging contact across a source and drain region when the applied gate voltage generates a sufficient electrostatic force to overcome the mechanical biasing of the cantilever beam. A second set of contacts can be added on the cantilever beam to form a complementary switching structure, or to a separate cantilever beam. The switching can be configured as non-volatile in response to stiction forces. NEM circuits provide a number of advantages within a variety of circuit types, including but not limited to: logic, memory, sleep circuits, pass circuits, and so forth.

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Ionescu et al. Modeling and design of a low voltage SOI suspended gate MOSFET (SG-MOSFET) with a metal-over-gate architecture. Proc. Int'l Symposium on Quality Electronic Design, 2002, pp. 1-6.

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