Metal impurity neutralization within semiconductors by fluorinat

Semiconductor device manufacturing: process – Gettering of substrate

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438473, 438477, 438528, 438795, H01L 21425

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active

059666234

ABSTRACT:
Fluorination can be used to neutralize transition metal impurities in Si. Fluorine is incorporated into the near-surface region of Si by implantation or annealing in a fluorine containing ambient. Thermal treatments at appropriate temperatures are used to initiate the interdiffusion and reaction between fluorine and metal contaminants. The impurities readily react with fluorine to form a compound or complex, thus significantly reducing the number of mid-gap impurities.

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