Metal gate capacitor fabricated with a silicon gate MOS process

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 52, 437 60, 437228, 437235, 437919, 357 236, 357 51, H01L 2170

Patent

active

050064800

ABSTRACT:
A method for making metal gate MOS capacitors with standard silicon gates processes, including the steps of providing a semiconductor substrate and defining active areas and capacitor areas therein, forming field oxide regions that generally surround the active areas and the capacitor areas, forming a gate oxide layer over the active areas and the capacitor areas, and forming polysilicon gates over the active areas. Highly doped source and drain regions in the active areas and highly doped bottom capacitor plate regions in the capacitor areas are then formed, and blanket oxide layer is deposited over the semiconductor structure. The capacitor areas are opened to expose the highly doped bottom capacitor plate regions, and the semiconductor structure is heated to reflow the deposited oxide layer and to grow a capacitor oxide layer over the exposed capacitor areas.

REFERENCES:
patent: 3693428 (1972-09-01), Ferrel
patent: 4001049 (1977-04-01), Baglin et al.
patent: 4214252 (1980-07-01), Goerth
patent: 4224089 (1980-09-01), Nishimoto et al.
patent: 4293588 (1981-10-01), Neukcomm
patent: 4413401 (1983-11-01), Klein et al.
patent: 4432133 (1984-02-01), Furuyama
patent: 4466177 (1984-08-01), Chao
patent: 4518630 (1985-05-01), Grasser
patent: 4535528 (1985-08-01), Chen et al.
patent: 4571607 (1986-02-01), Togei
patent: 4603059 (1986-07-01), Kiyosumi et al.
patent: 4638400 (1987-01-01), Brown et al.
patent: 4700457 (1987-10-01), Matsakawa
patent: 4746377 (1988-05-01), Kobayashi
Ghandhi, "VLSI Fabrication Principles" John Wiley and Sons, N.Y. 1983, pp. 300-301, 353-354, 631-633, 378-385.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metal gate capacitor fabricated with a silicon gate MOS process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metal gate capacitor fabricated with a silicon gate MOS process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal gate capacitor fabricated with a silicon gate MOS process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2034265

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.