Fishing – trapping – and vermin destroying
Patent
1990-02-13
1991-04-09
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 52, 437 60, 437228, 437235, 437919, 357 236, 357 51, H01L 2170
Patent
active
050064800
ABSTRACT:
A method for making metal gate MOS capacitors with standard silicon gates processes, including the steps of providing a semiconductor substrate and defining active areas and capacitor areas therein, forming field oxide regions that generally surround the active areas and the capacitor areas, forming a gate oxide layer over the active areas and the capacitor areas, and forming polysilicon gates over the active areas. Highly doped source and drain regions in the active areas and highly doped bottom capacitor plate regions in the capacitor areas are then formed, and blanket oxide layer is deposited over the semiconductor structure. The capacitor areas are opened to expose the highly doped bottom capacitor plate regions, and the semiconductor structure is heated to reflow the deposited oxide layer and to grow a capacitor oxide layer over the exposed capacitor areas.
REFERENCES:
patent: 3693428 (1972-09-01), Ferrel
patent: 4001049 (1977-04-01), Baglin et al.
patent: 4214252 (1980-07-01), Goerth
patent: 4224089 (1980-09-01), Nishimoto et al.
patent: 4293588 (1981-10-01), Neukcomm
patent: 4413401 (1983-11-01), Klein et al.
patent: 4432133 (1984-02-01), Furuyama
patent: 4466177 (1984-08-01), Chao
patent: 4518630 (1985-05-01), Grasser
patent: 4535528 (1985-08-01), Chen et al.
patent: 4571607 (1986-02-01), Togei
patent: 4603059 (1986-07-01), Kiyosumi et al.
patent: 4638400 (1987-01-01), Brown et al.
patent: 4700457 (1987-10-01), Matsakawa
patent: 4746377 (1988-05-01), Kobayashi
Ghandhi, "VLSI Fabrication Principles" John Wiley and Sons, N.Y. 1983, pp. 300-301, 353-354, 631-633, 378-385.
Chang C. P.
Farb Joseph
Denson-Low W. K.
Gudmestad Terje
Hearn Brian E.
Hughes Aircraft Company
Thomas Tom
LandOfFree
Metal gate capacitor fabricated with a silicon gate MOS process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metal gate capacitor fabricated with a silicon gate MOS process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal gate capacitor fabricated with a silicon gate MOS process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2034265