Metal foil interconnection of electrical devices

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S799000, C361S780000

Reexamination Certificate

active

08009439

ABSTRACT:
An electrical assembly (300, 400) includes a power IC such as a MOSFET (112, 412) attached to a substrate module (114, 214). The MOSFET includes a top surface comprising first and second conductive device surfaces (A, B), associated with first and second device ports, and a bottom surface comprising a third conductive device surface C associated with a third device port. A first foil element is bonded to the first conductive device surface(s) A and to each of the first conductive substrate surfaces (A1, A2) and provides a continuous conductive pathway from each conductive surface (A) to each other conductive surface (A) and to each conductive surface (A1, A2). A second foil element is bonded to the second conductive device surface(s) B and to the second conductive substrate surface B1and provides a continuous conductive pathway from each device conductive surface (B) to the substrate conductive surface (B1). A third foil element may be installed to electrically interconnect the discrete second device surfaces (B). The foil elements reduce interconnection parasitics and reduce charge and thermal energy density at device conductive surfaces as compared to wire bonded electrical interconnections. The foil elements may be comprised of formed metal elements that are flexible but sufficiently rigid to hold a formed shape or flexible foils supported on a flexible dielectric substrate.

REFERENCES:
patent: 6586704 (2003-07-01), Cockeram et al.
patent: 6992384 (2006-01-01), Joshi
patent: 7064011 (2006-06-01), Ikenaga et al.
patent: 2009/0052210 (2009-02-01), Ward et al.
patent: 2009/0140414 (2009-06-01), Soyano et al.
patent: 2009/0189264 (2009-07-01), Yato et al.
Lai, Zonghe, et al., “Effect of the Microstructure of Ni/Au Metallization on Bondability of FR-4 Substrate”, The Swedish Institute of Production Engineering research (IVF), S-431 53 Mölodal, Sweden.
Lai, Zonghe, et al., http://extra.ivf.se
gl/A-WireBonding/ChapterA.htm; Level 1, Level 2 and Level 4.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metal foil interconnection of electrical devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metal foil interconnection of electrical devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal foil interconnection of electrical devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2780173

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.