Metal-filled via/contact opening with thin barrier layers in int

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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438643, 438648, 438653, H01L 2348

Patent

active

059947756

ABSTRACT:
The invention comprises an integrated circuit structure, and a process for making same, comprising a via/contact opening in a dielectric layer; a CVD layer of titanium nitride having a thickness of at least about 50 Angstroms, but not exceeding about 200 Angstroms, on the sidewall and bottom surfaces of the via/contact opening to provide adherence of the filler material to the underlying and sidewall surface of the opening; a CVD barrier layer of tungsten, having a thickness of about 50 Angstroms, but not exceeding about 300 Angstroms, formed over the titanium nitride layer; and the remainder of the via/contact opening filled with a highly conductive metal selected from the group consisting of copper, CVD aluminum, and force-filled aluminum.

REFERENCES:
patent: 4822753 (1989-04-01), Pintchovski et al.
patent: 4994410 (1991-02-01), Sun et al.
patent: 5094981 (1992-03-01), Chung et al.
patent: 5149672 (1992-09-01), Lifshitz et al.
patent: 5238872 (1993-08-01), Thalapaneni
patent: 5250467 (1993-10-01), Somekh et al.
patent: 5254498 (1993-10-01), Sumi
patent: 5290588 (1994-03-01), Romero et al.
patent: 5356835 (1994-10-01), Somekh et al.
patent: 5371041 (1994-12-01), Liou et al.
patent: 5380678 (1995-01-01), Yu et al.
patent: 5391517 (1995-02-01), Gelatos et al.
patent: 5397742 (1995-03-01), Kim
patent: 5399526 (1995-03-01), Sumi
patent: 5403779 (1995-04-01), Joshi et al.
patent: 5407861 (1995-04-01), Marangon et al.
patent: 5413669 (1995-05-01), Fujita
patent: 5427666 (1995-06-01), Mueller et al.
patent: 5457069 (1995-10-01), Chen et al.
patent: 5462895 (1995-10-01), Chen
patent: 5480836 (1996-01-01), Harada et al.
patent: 5486492 (1996-01-01), Yamamoto et al.
patent: 5677237 (1997-10-01), Tsai et al.
patent: 5677238 (1997-10-01), Gn et al.
patent: 5714418 (1998-02-01), Bai et al.
Naik, Mehul B., et al., "CVD of Copper Using Copper (I) and Copper (II) .beta.-Diketonates", Thin Solid Films, vol. 262, 1995, pp. 60-66.

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