MEMS device trench plating process and apparatus for through...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal

Reexamination Certificate

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C257SE27001, C438S048000

Reexamination Certificate

active

11211624

ABSTRACT:
A method for forming through hole vias in a substrate uses a partially exposed seed layer to plate the bottom of a blind trench formed in the front side of a substrate. Thereafter, the plating proceeds substantially uniformly from the bottom of the blind hole to the top. To form the through hole, the rear face of the substrate is ground or etched away to remove material up to and including the dead-end wall of the blind hole.

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patent: 6897148 (2005-05-01), Halahan et al.
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Y. Nishi, Editor, “Handbook of Semiconductor Manufacturing Technology”, 2000, Marcel Dekker, pp. 402-413.
“RF MEMS and MEMS packaging,” M. Hara, et al., Second International Symposium on Acoustic Wave Devices for Future Mobile Communications Systems, Thursday, Mar. 4, 2004, pp. 115-122.
“Copper Metallization of Semiconductor Interconnects—Issues and Prospects”, Uziel Landau, Invited Talk, CMP, Symposium, Abstract # 505, Electrochemical Society Meeting, Phoenix, AZ, Oct. 22-27, 2000.

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