MEMS based conductivity-temperature-depth sensor for harsh...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S446000, C073S721000

Reexamination Certificate

active

07456638

ABSTRACT:
A MEMS-based silicon CTD sensor for ocean environment is presented. The sensor components are a capacitive conductivity sensor, a gold doped silicon temperature sensor, and a multiple diapghram piezoresistive pressure sensor. The sensor elements have further been packaged to protect them from harsh marine environment. The sensor components showed good linear response, resolution and mechanical integrity to the harsh ocean environment.

REFERENCES:
patent: 4238804 (1980-12-01), Warren
patent: 4646070 (1987-02-01), Yasuhara et al.
patent: 5446437 (1995-08-01), Bantien et al.
patent: 2004/0232923 (2004-11-01), Farruggia et al.
patent: 2005/0104607 (2005-05-01), Byington et al.
patent: 2005/0200056 (2005-09-01), Conti
patent: 2005/0274191 (2005-12-01), Hasegawa et al.
patent: 2006/0037390 (2006-02-01), Nakano et al.
patent: 2007/0018652 (2007-01-01), Broadbent et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MEMS based conductivity-temperature-depth sensor for harsh... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MEMS based conductivity-temperature-depth sensor for harsh..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MEMS based conductivity-temperature-depth sensor for harsh... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4020207

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.