MEMS based charged particle deflector design

Radiant energy – With charged particle beam deflection or focussing – With target means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S598000, C439S055000

Reexamination Certificate

active

06956219

ABSTRACT:
A microcolumn including a plurality of beam modification components coupled to an assembly substrate, wherein the plurality of beam modification components includes: (1) an extractor component; (2) a first focusing electrode component; (3) a first anode component; (4) a first deflector component; (5) a second focusing electrode component; (6) a second deflector component; (7) a third focusing electrode component; (8) a third deflector component; (9) a second anode component; (10) a fourth focusing electrode component; and (11) a third anode component. The beam modification components may be ordered on the substrate in this sequence or other sequences.

REFERENCES:
patent: 4963748 (1990-10-01), Szilagyi
patent: 5122663 (1992-06-01), Chang et al.
patent: 5963788 (1999-10-01), Barron et al.
patent: 6103399 (2000-08-01), Smela et al.
patent: 6219254 (2001-04-01), Akerling et al.
patent: 6300156 (2001-10-01), Decker et al.
patent: 6396711 (2002-05-01), Degani et al.
patent: 6398280 (2002-06-01), Parker et al.
patent: 6561725 (2003-05-01), Ellis et al.
patent: 6672795 (2004-01-01), Ellis et al.
patent: 6745567 (2004-06-01), Mercanzini
patent: 6762116 (2004-07-01), Skidmore
patent: 6881074 (2005-04-01), McLenaghan
patent: 2002/0125208 (2002-09-01), Christenson et al.
patent: 2004/0135526 (2004-07-01), Winkler et al.
Muray et al., “Advances in Arrayed Microcolumn Lithography”, Journal of Vacuum Science and Technology. B, Microelectronics and Nanometer Structures Processing, Measurement and Phenomena: An Official Publication of the American Vacuum Society, vol. 18 (6), Nov./Dec. 2000, pp. 3099-3104. (IRN10495228).
Dechev et al., “Microassembly of 3-D Microstructure Using a Compliant, Passive Microgripper,” Journal of Microelectromechanical Systems, vol. 13, No. 2, Apr. 2004, pp. 176-189.
Tsui et al., “Micromachined end-effector and techniques for directed MEMS assembly,” Journal of Micromechanics and Microengineering, Institute of Physics Publishing, United Kingdom 2004, pp. 1-8.
Ellis, et al., “High aspect ratio silicon micromechanical connectors”, High Aspect Ratio Micro-Structure Technology Workshop, Jun. 15-17, 2003, Monterey, California USA.
M. Szilagyi et al., “Synthesis of Electrostatic Focusing and Deflection Systems”, JVST B 15(6), Nov./Dec. 1997, pp 1971.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MEMS based charged particle deflector design does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MEMS based charged particle deflector design, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MEMS based charged particle deflector design will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3486515

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.