Memory testing system with algorithmic test data generation

Details Memory testing system with algorithmic test data generation Memory testing system with algorithmic test data generation

1991-12-18

1994-10-18

Beausoliel, Jr., Robert W.

Excavating

371 151, 371 211, G01R 3128, G06F 1100

Patent

active

053575237

ABSTRACT:
A system for providing test data for testing a semiconductor memory includes generation means for successively developing generated data patterns beginning from a seed data pattern, such that every distinct data pattern of the seed data pattern is successively developed in a forward sequence and, subsequently, the distinct data patterns are successively developed in a reverse sequence relative to the forward sequence.

REFERENCES:
patent: 4216374 (1980-08-01), Lam et al.
patent: 4222514 (1980-09-01), Bass
patent: 4654849 (1987-03-01), White et al.
patent: 4672307 (1987-06-01), Breuer et al.
patent: 4745355 (1988-05-01), Eichelberger et al.
patent: 4782487 (1988-11-01), Smelser
patent: 4860291 (1989-08-01), Damm et al.
patent: 4870346 (1989-09-01), Mydill et al.
patent: 4959832 (1990-09-01), Bardell
patent: 4980888 (1990-12-01), Bruce et al.
patent: 4989209 (1991-01-01), Littlebury et al.
Paul H. Bardell, Jr. & William H. Meanney; Built-in Test for RAMS, Aug. 1988, pp. 29-37 (IBM Corp.).
IBM Journal of Resaearch and Development, vol. 34, No. 2/3, Mar./May 1990, pp. 260-275, by C. W. Rodriguez, et al., entitled "The development of ultra-high-frequency VLSI device test systems".
International Test Conference 1989 Proceedings, 29 Aug. 1989, Washington, D.C., pp. 558-566, by S. Kikuchi, et al., entitled "A 250 MHz shared-resource VLSI test system with high pin count and memory test capability".
Paper on Algebraic Code Theory, Hamming Codes Revisited, Sec. 11.3, Ch. 10, Shannon's Main Theorem.

Affiliated with

Also associated with

Rating

Memory testing system with algorithmic test data generation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory testing system with algorithmic test data generation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory testing system with algorithmic test data generation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2378195