Memory test system

Details Memory test system Memory test system

1996-12-16

1998-02-24

Canney, Vincent P.

Excavating

371 216, G06F 1100

Patent

active

057217416

ABSTRACT:
A process for reducing the test requirements of memory devices once they are packaged into modules by using a unique identification of a memory device based on the locations or types and locations of some of the defects in that memory device. The unique identification is used as an index to access a database containing more information on the types and locations of defects within that memory device. The information is then stored in a non-volatile memory on the module containing that memory device.

REFERENCES:
patent: 5461588 (1995-10-01), Sardeson et al.
patent: 5532963 (1996-07-01), Koshiyama et al.

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