Memory structure and method of programming

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185190, C365S185220, C365S185250

Reexamination Certificate

active

11116614

ABSTRACT:
A memory and a method for programming a memory device are discussed. The method comprises selecting a cell to program, wherein the cell is coupled to a bit line, applying a first programming pulse, wherein the first programming pulse comprises applying a first voltage to the bit line, verifying if the cell is programmed after applying the first programming pulse, and applying a second programming pulse to the bit line after applying the first programming pulse if the cell is not programmed after applying the first programming pulse, wherein second programming pulse comprises applying a second voltage to the bit line, wherein the second voltage is different than the first voltage.

REFERENCES:
patent: 5991201 (1999-11-01), Kuo et al.
patent: 6046932 (2000-04-01), Bill et al.
patent: 6275415 (2001-08-01), Haddad et al.
patent: 6714448 (2004-03-01), Manea
patent: 6747901 (2004-06-01), Hirano
patent: 6882567 (2005-04-01), Wong
patent: 6903972 (2005-06-01), Lasser et al.
patent: 6909638 (2005-06-01), Choy et al.
patent: 7042766 (2006-05-01), Wang et al.
patent: 2004/0218421 (2004-11-01), Choy et al.
Bude, J.D. et al. ; “EEPROM/Flash Sub 3.0V Drain-Source Bias Hot Carrier Writing”; IEDM; 1995; pp. 3.7.1-3.7.3; IEEE; USA.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Memory structure and method of programming does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory structure and method of programming, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory structure and method of programming will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3876506

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.