Optics: measuring and testing – Document pattern analysis or verification
Patent
1978-11-03
1984-07-10
Punter, William H.
Optics: measuring and testing
Document pattern analysis or verification
235435, 356394, 371 1, G06K 701, G06K 710, G11B 543
Patent
active
044590210
ABSTRACT:
A registration system for use with a document inspection system wherein a test document is compared with a master document stored in a computer memory in which the registration system has means for aligning each point on the test document with its corresponding point of the stored master document. The document inspection system optically scans each point on the test document and provides real time input to a flaw detector. The registration system optically scans the leading corners of the test document and generates addresses to read out from memory each point on the master document in precise registration with its corresponding point on the test document corrected for misalignment of the test document relative to the stored master document.
REFERENCES:
patent: 3230350 (1966-01-01), Mendelson et al.
patent: 3350545 (1967-10-01), Street
patent: 3781829 (1973-12-01), Singh
patent: 4118730 (1978-10-01), Lemelson
patent: 4179685 (1979-12-01), O'Maley
patent: 4197584 (1980-04-01), Blazek
Smith et al., "A New Algorithm for Edge Detection", Computer Graphics & Image Processing, vol. 4, 1975, pp. 55-62.
Grimes Edwin T.
Masselle Francis L.
Murphy Thomas P.
Punter William H.
The Perkin-Elmer Corporation
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