Memory for storing response patterns in an automatic testing ins

Details Memory for storing response patterns in an automatic testing ins Memory for storing response patterns in an automatic testing ins

1986-10-02

1988-09-20

Atkinson, Charles E.

Excavating

G01R 3128

Patent

active

047730714

ABSTRACT:
In an automatic testing instrument, to store responses educed from an equipment (4) under test in response to stimuli sent thereto, a response memory (16) is used. This response memory includes two serial/parallel shift registers (Z5, Z4), a buffer (Z2), a static RAM (Z3) and an input/output buffer (Z1). The response memory is capable of accepting the data bits being transmitted by the equipment under test at different data rates, corresponding to either serial or parallel inputted data bits.

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