Memory device with chemical vapor deposition of titanium for...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257SE23161, C257SE23167, C257SE23029, C257SE21168, C257SE21584, C257S906000, C257S296000, C257S750000, C257S763000, C257S764000

Reexamination Certificate

active

07443032

ABSTRACT:
A titanium layer is formed on a substrate with chemical vapor deposition (CVD). First, a seed layer is formed on the substrate by combining a first precursor with a reducing agent by CVD. Then, the titanium layer is formed on the substrate by combining a second precursor with the seed layer by CVD. The titanium layer is used to form contacts to active areas of substrate and for the formation of interlevel vias.

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