Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-06-07
2008-10-28
Williams, Alexander O (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257SE23161, C257SE23167, C257SE23029, C257SE21168, C257SE21584, C257S906000, C257S296000, C257S750000, C257S763000, C257S764000
Reexamination Certificate
active
07443032
ABSTRACT:
A titanium layer is formed on a substrate with chemical vapor deposition (CVD). First, a seed layer is formed on the substrate by combining a first precursor with a reducing agent by CVD. Then, the titanium layer is formed on the substrate by combining a second precursor with the seed layer by CVD. The titanium layer is used to form contacts to active areas of substrate and for the formation of interlevel vias.
REFERENCES:
patent: 3900312 (1975-08-01), Terry et al.
patent: 4340617 (1982-07-01), Deutsch et al.
patent: 4343870 (1982-08-01), Heller et al.
patent: 4359490 (1982-11-01), Lehrer
patent: 4527184 (1985-07-01), Fischer
patent: 4713258 (1987-12-01), Umemura
patent: 4721631 (1988-01-01), Endo et al.
patent: 4751101 (1988-06-01), Joshi
patent: 4782380 (1988-11-01), Shankar et al.
patent: 4868005 (1989-09-01), Ehrlich et al.
patent: 4876112 (1989-10-01), Kaito et al.
patent: 4884123 (1989-11-01), Dixit et al.
patent: 4923717 (1990-05-01), Gladfelter et al.
patent: 4957777 (1990-09-01), Ilderem et al.
patent: 4971655 (1990-11-01), Stefano et al.
patent: 4994410 (1991-02-01), Sun et al.
patent: 5005519 (1991-04-01), Egermeier et al.
patent: 5015330 (1991-05-01), Okumura et al.
patent: 5022905 (1991-06-01), Grundy et al.
patent: 5032233 (1991-07-01), Yu et al.
patent: 5049975 (1991-09-01), Ajika et al.
patent: 5124780 (1992-06-01), Sandhu et al.
patent: 5136362 (1992-08-01), Grief et al.
patent: 5147819 (1992-09-01), Yu et al.
patent: 5173327 (1992-12-01), Sandhu et al.
patent: 5192589 (1993-03-01), Sandhu
patent: 5196360 (1993-03-01), Doan et al.
patent: 5202579 (1993-04-01), Fujii et al.
patent: 5227331 (1993-07-01), Westmoreland
patent: 5227334 (1993-07-01), Sandhu
patent: 5229643 (1993-07-01), Ohta et al.
patent: 5232873 (1993-08-01), Geva et al.
patent: 5239196 (1993-08-01), Ikeda et al.
patent: 5240739 (1993-08-01), Doan et al.
patent: 5246881 (1993-09-01), Sandhu et al.
patent: 5252518 (1993-10-01), Sandhu et al.
patent: 5254499 (1993-10-01), Sandhu et al.
patent: 5258096 (1993-11-01), Sandhu et al.
patent: 5273783 (1993-12-01), Wanner
patent: 5275715 (1994-01-01), Tuttle
patent: 5278100 (1994-01-01), Doan et al.
patent: 5306951 (1994-04-01), Lee et al.
patent: 5320880 (1994-06-01), Sandhu et al.
patent: 5341016 (1994-08-01), Prall et al.
patent: 5344792 (1994-09-01), Sandhu et al.
patent: 5355020 (1994-10-01), Lee et al.
patent: 5374591 (1994-12-01), Hasegawa et al.
patent: 5376405 (1994-12-01), Doan et al.
patent: 5381302 (1995-01-01), Sandhu et al.
patent: 5384284 (1995-01-01), Doan et al.
patent: 5384289 (1995-01-01), Westmoreland
patent: 5391410 (1995-02-01), Nii et al.
patent: 5393564 (1995-02-01), Westmoreland et al.
patent: 5399379 (1995-03-01), Sandhu
patent: 5401674 (1995-03-01), Anjum et al.
patent: 5416045 (1995-05-01), Kauffman et al.
patent: 5425392 (1995-06-01), Thakur et al.
patent: 5444018 (1995-08-01), Yost et al.
patent: 5453640 (1995-09-01), Kinoshita
patent: 5459353 (1995-10-01), Kanazawa
patent: 5496762 (1996-03-01), Sandhu et al.
patent: 5506166 (1996-04-01), Sandhu et al.
patent: 5508066 (1996-04-01), Akahori
patent: 5534716 (1996-07-01), Takemura
patent: 5567243 (1996-10-01), Foster et al.
patent: 5571572 (1996-11-01), Sandhu
patent: 5575708 (1996-11-01), Chau et al.
patent: 5595784 (1997-01-01), Kaim et al.
patent: 5607722 (1997-03-01), Vaartstra et al.
patent: 5633200 (1997-05-01), Hu
patent: 5641545 (1997-06-01), Sandhu
patent: 5644166 (1997-07-01), Honeycutt et al.
patent: 5654577 (1997-08-01), Nakamura et al.
patent: 5693557 (1997-12-01), Hirao et al.
patent: 5703403 (1997-12-01), Sobue et al.
patent: 5725739 (1998-03-01), Hu
patent: 5747116 (1998-05-01), Sharan et al.
patent: 5773890 (1998-06-01), Uchiyama et al.
patent: 5828131 (1998-10-01), Cabral, Jr. et al.
patent: 5834371 (1998-11-01), Ameen et al.
patent: 5838052 (1998-11-01), McTeer
patent: 5846881 (1998-12-01), Sandhu et al.
patent: 5924012 (1999-07-01), Vaarstra
patent: 5956595 (1999-09-01), Zenke
patent: 5970309 (1999-10-01), Ha et al.
patent: 5973402 (1999-10-01), Shinriki et al.
patent: 5976976 (1999-11-01), Doan et al.
patent: 6016012 (2000-01-01), Chatila et al.
patent: 6031288 (2000-02-01), Todorobaru et al.
patent: 6051880 (2000-04-01), Kikuta
patent: 6066891 (2000-05-01), Yamaoka et al.
patent: 6120844 (2000-09-01), Chen et al.
patent: 6140230 (2000-10-01), Li
patent: 6143362 (2000-11-01), Sandhu et al.
patent: 6143649 (2000-11-01), Tang
patent: 6153490 (2000-11-01), Xing et al.
patent: 6208033 (2001-03-01), Doan et al.
patent: 6217721 (2001-04-01), Xu et al.
patent: 6255216 (2001-07-01), Doan et al.
patent: 6284316 (2001-09-01), Sandhu et al.
patent: 6294469 (2001-09-01), Kulkarni et al.
patent: 6320213 (2001-11-01), Kirlin et al.
patent: 6420262 (2002-07-01), Farrar
patent: 6433434 (2002-08-01), Sandhu et al.
patent: 6472756 (2002-10-01), Doan et al.
patent: 6503803 (2003-01-01), Todorobaru et al.
patent: 6509278 (2003-01-01), Chen
patent: 6531736 (2003-03-01), Koike
patent: 6605533 (2003-08-01), Trivedi
patent: 6903462 (2005-06-01), Sandhu et al.
patent: 6940172 (2005-09-01), Sandhu et al.
patent: 6969671 (2005-11-01), Shimazu et al.
patent: 2001/0042505 (2001-11-01), Vaarstra
patent: 2002/0000263 (2002-01-01), Sandhu et al.
patent: 2002/0000662 (2002-01-01), Sandhu et al.
patent: 2002/0006525 (2002-01-01), Sandhu et al.
patent: 2002/0011615 (2002-01-01), Nagata et al.
patent: 2007/0235709 (2007-10-01), Kostylev et al.
patent: 0798777 (1997-10-01), None
patent: 04-196419 (1992-07-01), None
patent: 404196419 (1992-07-01), None
patent: 56995 (1993-01-01), None
patent: 40-7097679 (1995-04-01), None
patent: 8-176823 (1996-07-01), None
patent: WO-98/34445 (1998-08-01), None
Bachmann, P. , et al., “Plasma-Assisted Chemical Vapor Deposition Processes”,MRS Bulletin, (Dec. 1988),52-59.
Bouteville, A. , et al., “TiSi2 Selective Growth in a rapid thermal low pressure chemical vapor depositoin system”,Journal of the Electrochemical Society, 139, (Aug. 1992),2260-2263.
Cowher, M. , et al., “Low Temperature CVD Garnet Growth”,Journal of Crystal Growth, 46, (1979),399-402.
Engqvist, Jan , et al., “Selective deposition of TiSi2 from H2-TiCl4 Gas mixtures and si: Aspects of Thermodynamics including Critical evaluation of thermochemical data in the Ti-Si System”,Journal of the Electrochemical Society, 139, (Nov. 1992),3197-3205.
Esquivel, A. , et al., “Electrical and Physical Characteristics of Dry Oxygen, High Pressure Oxidation for SUB-0.5 um CMOS Isolation”,Abst. Int'l Electron Devices Meeting, (1994).
Herman, I. , “Laser-Assisted Deposition of Thin Films from Gas-Phase and Surface-Adsorbed Molecules”,Chem. Rev., 89, (1989),1323, 1346-1349.
Ilderem, V. , et al., “Optimized Deposition Parameters for Low Pressure Chemical Vapor Deposited Titanium Silicide”,J. Electrochemical Soc. : Solid State Science and Technology, (Oct. 1988),2590-2596.
Lee, Jaegab , et al., “Plasma enhanced chemical vapor deposition of blanket TiSi2 on oxide patterned wafers”,Journal of the Electrochemical Society, 139, (Apr. 1992),1159-1165.
Lie, L. , et al., “High Pressure Oxidation of Silicon in Dry Oxygen”,J. Electrochemical Soc. : Solid State Science and Technology, 129, (Dec. 1982),2828-2834.
Moeller, T. , et al., “Semiconducting Elements, Ch. 30”,In: Chemistry with Inorganic Qualitative Analysis, 2nd Edition, Academic Press,(1984),995-996.
Morosanu, C. ,Thin Films by Chemical Vapor Deposition, Elsevier, N.Y.,(1990),42-54 & 460-475.
Panson, A. , et al., “Chemical Vapor Deposition of YBa(2)Cu(3)O(7) Using Metalorganic Chelate Precursors”,Appl. Phys. Lett., 53, (Oct. 1988), 1756-1758.
Rosler, R. , et al., “Plasma-Enhanced CVD of Titanium Silicide”,J. Vacuum Science Tech., B2(4), (Oct./Dec. 198),733-737.
Wolf, S. ,Silicon Processing for the VLSI Era, vol. 2: Process Integration, Lattice Press, Sunset Beach, California,(1990),202-203.
Yu, M. , et al., “Surface Chemistry of the WF(6)- Based Chemical Vapor Deposition of Tungsten”,I
Sandhu Gurtej Singh
Westmoreland Donald L.
Micro)n Technology, Inc.
Schwegman Lundberg & Woessner, P.A.
Williams Alexander O
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