Memory device utilizing ion beam readout

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250309, G01M 2300

Patent

active

040888959

ABSTRACT:
The invention is a memory for use in computing machines, in which the presence of a stored bit of information in a substrate is detected by a scanned ion beam of high brightness focused to a very small diameter. Bits of 4000 Angstrom dimension may be written in times as short as 100 nanoseconds by means of ion beams, and read out in times shorter than one nanosecond. A memory with such a bit size having a capacity of 10.sup.8 bits occupies 4 .times. 4 mm.sup.2 of substrate surface. By detecting the charge of high-energy ions transmitted through a thin substrate, bits smaller than 1000 Angstroms in dimension may be detected with good signal-to-noise ratio in less than 1 nanosecond.

REFERENCES:
patent: 3434894 (1969-03-01), Gale
patent: 3445926 (1969-05-01), Medved et al.
patent: 3878392 (1975-04-01), Yew et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Memory device utilizing ion beam readout does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory device utilizing ion beam readout, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory device utilizing ion beam readout will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2359487

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.