Memory device tester and method for testing reduced power...

Static information storage and retrieval – Powering – Conservation of power

Reexamination Certificate

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C365S201000, C365S226000

Reexamination Certificate

active

06914843

ABSTRACT:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

REFERENCES:
patent: 5226120 (1993-07-01), Brown et al.
patent: 5361389 (1994-11-01), Fitch
patent: 5606664 (1997-02-01), Brown et al.
patent: 5982643 (1999-11-01), Phlipot
patent: 6047346 (2000-04-01), Lau et al.
patent: 6154821 (2000-11-01), Barth et al.
patent: 6175279 (2001-01-01), Ciccarelli et al.
patent: 6388695 (2002-05-01), Nagumo
patent: 6418070 (2002-07-01), Harrington et al.
patent: 6512715 (2003-01-01), Okamoto et al.
patent: 6545549 (2003-04-01), Swoboda
patent: 6587393 (2003-07-01), Ayukawa et al.
patent: 6643787 (2003-11-01), Zerbe
patent: 6674677 (2004-01-01), Harrington et al.
patent: 6775192 (2004-08-01), Harrington et al.
patent: 2001/0043122 (2001-11-01), Swoboda
patent: 2002/0007264 (2002-01-01), Swoboda
patent: 2002/0190708 (2002-12-01), Harrington et al.

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