Excavating
Patent
1986-12-23
1988-12-27
Atkinson, Charles E.
Excavating
371 13, G06F 1110
Patent
active
047945974
ABSTRACT:
In a storage unit equipped with a Reliablity, Availability and Serviceability (RAS) circuit, including a memory unit constructed of, e.g., a dynamic random access memory (DRAM) unit, for storing data with an error coding code (ECC), and an ECC unit constructed of e.g., an ECC checking circuit, for correcting a 1-bit error and detecting a 1-bit error, or more than 2-bit error contained in the data read from the memory unit, an ECC diagnostic unit is connected between said memory unit and said ECC unit, and an error made concerning the memory unit and ECC unit is diagnosed by the ECC diagnostic unit by selectively inverting the data read from the memory unit into diagnostic data during the checking operation of the ECC units to diagnose proper operation of the ECC unit and detect erros.
REFERENCES:
patent: 3257546 (1966-06-01), McGovern
patent: 3405258 (1968-10-01), Goody et al.
patent: 3465132 (1969-09-01), Crockett et al.
patent: 3491337 (1970-01-01), Guzak, Jr. et al.
patent: 3688265 (1972-08-01), Carter et al.
patent: 4493081 (1985-01-01), Schmidt
patent: 4506362 (1985-03-01), Morley
patent: 4561095 (1985-12-01), Khan
Williams et al., Monitoring Error-Correcting Circuits, IBM Technical Discl. Bulletin, vol. 10, No. 11, Apr. 1968, pp. 1800-1801.
Barshun et al., Self-Testing ECC Logic, IBM Tech. Discl. Bulletin, vol. 20, No. 7, Dec. 1977, pp. 2733-2744.
Testing Storage Parity Checking Logic, IBM Tech. Discl. Bulletin, vol. 28, No. 2, Jul. 1985, pp. 663-664.
Intel Corp., "Microsystem Components Handbook", Microprocessors and Peripherals vol. 11, 1985, pp. 5-39, 5-52, 5-87, 5-89 & 5-127.
Elecktronik 1980, Issue 26, pp. 58-60.
Elecktronik Informationen No. 1-1985, pp. 2, 34-36.
Kojima Tooru
Ooba Kunio
Atkinson Charles E.
Mitsubishi Denki & Kabushiki Kaisha
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