Memory defect redress analysis treating method, and memory...

Details Memory defect redress analysis treating method, and memory... Memory defect redress analysis treating method, and memory...

2005-06-14

2005-06-14

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S185000, C702S186000

Reexamination Certificate

active

06907385

ABSTRACT:
There are provided a failure repair analyzing and processing method and a memory testing apparatus provided with a failure repair analyzing and processing apparatus using this method, that are capable of reducing a time duration required to perform the failure repair analysis and processing for a multi-bit memory having redundancy structure. A plurality of repair analysis units as well as a common failure analysis memory are provided, and these repair analysis units are concurrently operated in parallel with each other, thereby to carry out respective repair analyses and processings for failure memory cells of plural data bits read out from the failure analysis memory in the plural repair analysis units concurrently and in parallel with each other. As a result, a time duration required to execute the failure repair analysis and processing is shortened.

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