Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2011-04-05
2011-04-05
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S295000, C257SE21001, C438S003000
Reexamination Certificate
active
07919794
ABSTRACT:
A memory including a memory cell and method for producing the memory cell are disclosed. The memory includes a substrate in a first plane. A first metal connection extending in a second plane is provided. The second plane is substantially perpendicular to the first plane. A magnetic tunnel junction (MTJ) is provided having a first layer coupled to the metal connection such that the first layer of the MTJ is oriented along the second plane.
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patent: 6841820 (2005-01-01), Komuro et al.
patent: 2006/0092690 (2006-05-01), Kim et al.
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International Search Report—PCT/US09/030451, International Search Authority—European Patent Office—Jun. 5, 2009.
Written Opinion—PCT/US09/030451, International Search Authority—European Patent Office—Jun. 5, 2009.
Gu Shiqun
Kang Seung H.
Nowak Matt
Diallo Mamadou
Pauley Nicholas J.
Qualcomm Incorporated
Richards N Drew
Talpalatsky Sam
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