Memory block erasing in a flash memory device

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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Details

C365S185300, C365S185220

Reexamination Certificate

active

06975538

ABSTRACT:
An erase pulse is applied to the memory block to be erased. An erase verification operation is performed to verify that each memory cell of the memory block is erased. If a memory cell has a current less than a first sense amplifier current reference level, additional erase pulses are applied to that cell until either the erase current is in the range of 30–40 μA or a maximum quantity of erase pulses have been applied. A leakage check is performed to determine if any cells have been overerased. If a cell has an erase current greater than or equal to a second sense amplifier current reference level, soft programming pulses are applied to the cell until either its erase current is less than the second reference level or a maximum quantity of soft program pulses have been applied.

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