Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-08-02
2011-08-02
Lee, Hwa S. A (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07990542
ABSTRACT:
An interferometer produces a first optical signal and a second optical signal interfering with each other. The optical signals are converted digital signals form addresses. A memory stores data values corresponding to the first and second optical signals, and in which the addresses are used to directly read the data values stored at the addresses. The data values stored in the memory can be dynamically adapting while converting the first and second optical signals and reading the data values.
REFERENCES:
patent: 4583856 (1986-04-01), Moore
patent: 4641971 (1987-02-01), Korth
patent: 4886363 (1989-12-01), Jungquist
patent: 2009/0257067 (2009-10-01), Chapman et al.
patent: 0511117 (1992-10-01), None
Brinkman Dirk
Yerazunis William S.
A Lee Hwa S.
Brinkman Dirk
Mitsubishi Electric Research Laboratories Inc.
Vinokur Gene
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