Memory architecture and cell design employing two access...

Static information storage and retrieval – Format or disposition of elements

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S063000, C365S163000

Reexamination Certificate

active

07606055

ABSTRACT:
An improved memory array architecture and cell design is disclosed in which the cell employs two access transistors. In one embodiment, the two access transistors in each cell are coupled at one of their channel terminals to a memory element, which in turn is connected to a bit line. The other of the channel terminals are effectively tied together via reference lines. The word lines (i.e., gates) of the two access transistors are also tied together. The result in a preferred embodiment is a cell having two access transistors wired and accessed in parallel. With such a configuration, the widths of the access transistors can be made one-half the width of more-traditional one-access-transistor designs, saving layout space in that (first) dimension. Moreover, because the word lines of adjacent cells will be deselected, the improved design does not require cell-to-cell isolation (e.g., trench isolation) in the other (second) dimension. The result, when applied to a phase change memory, comprises about a 37% reduction in layout area from previous cell designs.

REFERENCES:
patent: 5923593 (1999-07-01), Hsu et al.
patent: 6839267 (2005-01-01), Poechnueller
patent: 7095647 (2006-08-01), Jenne et al.
patent: 2006/0120148 (2006-06-01), Kim et al.
S.H. Lee et al., “Full Integration and Cell Characteristics for 64Mb Nonvolatile PRAM,” 2004 Symp. on VLSI Technology Digest of Technical Papers, pp. 20-21 (2004).
S. Hudgens and B. Johnson, “Overview of Phase-Change Chalcogenide Nonvolatile Memory Technology,” MRS Bulletin, pp. 829-832 (Nov. 2004).
F. Yeung et al., “Ge2Sb2Te5 Confined Structures and Integration of 64 Mb Phase-Change Random Access Memory,” Japanese Journal of Applied Physics, vol. 44, No. 4B, pp. 2691-2695 (2005).
Y.N. Hwang et al., “Full Integration and Reliability Evaluation of Phase-change RAM Based on 0.24um-CMOS Technologies,” 2003 Symposium on VLSI Technology Digest of Technical Papers, pp. 173-147 (2003).
W.Y. Cho, et al., “A 0.18-um 3.0-V 64-Mb Nonvolatile Phase-Transition Random Access Memory (PRAM),” IEEE Journal of Solid-State Circuits, vol. 40, No. 1, pp. 293-300 (Jan. 2005).
F. Bedeschi, et al., “An 8Mb Demonstrator for High-Density 1.8V Phase-Change Memories,” 2004 Symposium on VLSI Circuits Digest of Technical Papers, pp. 442-445 (2004).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Memory architecture and cell design employing two access... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory architecture and cell design employing two access..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory architecture and cell design employing two access... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4133196

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.