Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-01-16
1999-11-23
Karlsen, Ernest
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, 324757, G01R 3102
Patent
active
059906952
ABSTRACT:
A membrane test probe for an integrated circuit has a support frame, an annular substrate fixed to the support frame, and a flexible membrane fixed to and stretched tightly across the annular substrate. The membrane has an intermediate area that includes a plurality of probe contacts on its lower surface that are configured and arranged to be pressed against contact pads of an integrated circuit to be tested. A plurality of conductive traces are connected to the button contacts and configured and arranged for connection to test circuitry. The membrane test probe also includes a support plate for engaging an upper surface of the intermediate area and an adjustment mechanism for leveling the support plate and tensioning the membrane. The adjustment mechanism includes an adjustment ring, a lever ring and a pressure plate frame. The pressure plate frame engages the support plate and urges the same against the intermediate area of the membrane. The lever ring has a plurality of radial levers that push against the pressure plate frame at a plurality of spaced locations, and the support ring has a plurality of individually adjustable plungers deflecting respective radial levers for leveling the support plate and tensioning the membrane.
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patent: 5264787 (1993-11-01), Woith et al.
patent: 5355079 (1994-10-01), Evans et al.
patent: 5461326 (1995-10-01), Woith et al.
Griffin Patrick M.
Karlsen Ernest
Kobert Russell M.
Packard Hughes Interconnect Co.
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