Membrane probing system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S755090, C324S765010

Reexamination Certificate

active

06838890

ABSTRACT:
A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.

REFERENCES:
patent: 3401126 (1968-09-01), Miller et al.
patent: 3429040 (1969-02-01), Miller
patent: 3541222 (1970-11-01), Parks et al.
patent: 3596228 (1971-07-01), Reed, Jr. et al.
patent: 3634807 (1972-01-01), Grobe et al.
patent: 3654585 (1972-04-01), Wichersham
patent: 3680037 (1972-07-01), Nellis et al.
patent: 3806801 (1974-04-01), Bove
patent: 3839672 (1974-10-01), Anderson
patent: 3862790 (1975-01-01), Davies et al.
patent: 3971610 (1976-07-01), Buchoff et al.
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4038599 (1977-07-01), Bove et al.
patent: 4184729 (1980-01-01), Parks et al.
patent: 4581679 (1986-04-01), Smolley
patent: 4636722 (1987-01-01), Ardezzone
patent: 4636772 (1987-01-01), Yasunaga
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4663840 (1987-05-01), Ubbens et al.
patent: 4707657 (1987-11-01), Bøegh-Petersen
patent: 4793814 (1988-12-01), Zifcak
patent: 4837507 (1989-06-01), Hechtman
patent: 4906920 (1990-03-01), Huff et al.
patent: 4912399 (1990-03-01), Greub et al.
patent: 4918383 (1990-04-01), Huff et al.
patent: 4922192 (1990-05-01), Gross et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 4980637 (1990-12-01), Huff et al.
patent: 4987100 (1991-01-01), McBride et al.
patent: 4991290 (1991-02-01), MacKay
patent: 5020219 (1991-06-01), Leedy
patent: 5059898 (1991-10-01), Barsotti et al.
patent: 5061192 (1991-10-01), Chapin et al.
patent: 5069628 (1991-12-01), Crumly
patent: 5097101 (1992-03-01), Trobough
patent: 5126286 (1992-06-01), Chance
patent: 5133119 (1992-07-01), Afshari et al.
patent: 5134365 (1992-07-01), Okubo et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5177438 (1993-01-01), Littlebury et al.
patent: 5180977 (1993-01-01), Huff
patent: 5207585 (1993-05-01), Byrnes et al.
patent: 5225037 (1993-07-01), Elder et al.
patent: 5293175 (1994-03-01), Hemmie et al.
patent: 5313157 (1994-05-01), Pasiecznik, Jr.
patent: 5355079 (1994-10-01), Evans et al.
patent: 5389885 (1995-02-01), Swart
patent: 5395253 (1995-03-01), Crumly
patent: 5412866 (1995-05-01), Woith et al.
patent: 5453404 (1995-09-01), Leedy
patent: 5506515 (1996-04-01), Godshalk et al.
patent: 5517126 (1996-05-01), Yamaguchi
patent: 5521518 (1996-05-01), Higgins
patent: 5537372 (1996-07-01), Albrecht et al.
patent: 5584120 (1996-12-01), Roberts
patent: 5589781 (1996-12-01), Higgins et al.
patent: 5623213 (1997-04-01), Liu et al.
patent: 5623214 (1997-04-01), Pasiecznik
patent: 5720098 (1998-02-01), Kister
patent: 5723347 (1998-03-01), Hirano et al.
patent: 5742174 (1998-04-01), Kister et al.
patent: 5813847 (1998-09-01), Eroglu et al.
patent: 5814847 (1998-09-01), Shihadeh et al.
patent: 5869974 (1999-02-01), Akram et al.
patent: 5876082 (1999-03-01), Kempf et al.
patent: 5896038 (1999-04-01), Budnaitis et al.
patent: 5914613 (1999-06-01), Gleason et al.
patent: 5926029 (1999-07-01), Ference et al.
patent: 5973504 (1999-10-01), Chong
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 6059982 (2000-05-01), Palagonia et al.
patent: 6114864 (2000-09-01), Soejima et al.
patent: 6174744 (2001-01-01), Watanabe et al.
patent: 6256882 (2001-07-01), Gleason et al.
patent: 20010009061 (2001-07-01), Gleason et al.
patent: 20010030549 (2001-10-01), Gleason et al.
patent: 42 23 658 (1993-01-01), None
patent: 0230348 (1987-07-01), None
patent: 0230 348 (1987-07-01), None
patent: 0259163 (1988-09-01), None
patent: 9807040 (1998-02-01), None
patent: WO 98 07040 (1998-02-01), None
Fink, Donald G., Bridge Circuits, Detectors, and Amplifiers, Electronic Engineers' Handbook, First Edition, 1975, pp. 17-22 -17-27, McGraw-Hill, Inc., New York.
Kim, Yong-Dae, et al.: Fabrication of a Silicon Micro-Probe for Vertical Probe Card Application, In: Japan J. Appl. Phys., vol. 37, 1998, S. 7070-7073.

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