Membrane dielectric isolation IC fabrication

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Interconnecting plural devices on semiconductor substrate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438618, 438778, 438928, 438977, 438967, H04L 2100

Patent

active

058405933

ABSTRACT:
General purpose methods for the fabrication of integrated circuits from flexible membranes formed of very thin low stress dielectric materials, such as silicon dioxide or silicon nitride, and semiconductor layers. Semiconductor devices are formed in a semiconductor layer of the membrane. The semiconductor membrane layer is initially formed from a substrate of standard thickness, and all but a thin surface layer of the substrate is then etched or polished away. In another version, the flexible membrane is used as support and electrical interconnect for conventional integrated circuit die bonded thereto, with the interconnect formed in multiple layers in the membrane. Multiple die can be connected to one such membrane, which is then packaged as a multi-chip module. Other applications are based on (circuit) membrane processing for bipolar and MOSFET transistor fabrication, low impedance conductor interconnecting fabrication, flat panel displays, maskless (direct write) lithography, and 3D IC fabrication.

REFERENCES:
patent: 4070230 (1978-01-01), Stein
patent: 4131985 (1979-01-01), Grenwood et al.
patent: 4465759 (1984-08-01), Duly et al.
patent: 4539068 (1985-09-01), Takagi et al.
patent: 4618397 (1986-10-01), Shimizu et al.
patent: 4702936 (1987-10-01), Maeda et al.
patent: 4721938 (1988-01-01), Stevenson
patent: 4784721 (1988-11-01), Holmen et al.
patent: 4818661 (1989-04-01), Taylor et al.
patent: 5071510 (1991-12-01), Findler et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Membrane dielectric isolation IC fabrication does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Membrane dielectric isolation IC fabrication, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Membrane dielectric isolation IC fabrication will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1701234

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.