Member for use in assembly of integrated circuit elements and a

Details Member for use in assembly of integrated circuit elements and a Member for use in assembly of integrated circuit elements and a

1990-07-17

1992-09-22

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 225, 437 8, G01R 3128

Patent

active

051500477

ABSTRACT:
An apparatus for assembly and testing of an IC element having a first section designated for primary functions of the IC element and a second section designated for testing of the IC element, including a substrate made of a film of insulating material and having an IC-mounting portion defining a position of IC element to be assembled a plurality of first leads mounted on the substrate and connected to the first section of the IC element when mounted to the IC-mounting portion, a plurality of second leads connected to the second section of the IC element, a single first test pad for connection of the first leads thereto, second test pads for connection of the respective second leads thereto and circuit for connecting the first leads to at least one of the second leads for testing the IC element through the first and second pads.

REFERENCES:
patent: 4386389 (1983-05-01), Proebsting
patent: 4772936 (1988-09-01), Reding et al.
patent: 4792532 (1988-12-01), Ohtani et al.
patent: 4806409 (1989-02-01), Walter et al.
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 5008614 (1991-04-01), Shreeve et al.
IBM Technical Disclosure Bulletin, vol. 31, No. 4, Sep. 1988, pp. 30-31 "Testable TAB Tape with Inner Guard Ring".
Japan Semiconductor Yearbook 1988, pp. 402-405.
Nikkey Microdevice, Press Journal Co., Sep. 1987, pp. 99-106.

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