Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Reexamination Certificate
2006-09-12
2006-09-12
Kornakov, M. (Department: 1746)
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
C134S001000, C134S031000, C134S034000, C134S042000, C438S906000, C310S311000, C310S316010, C310S317000
Reexamination Certificate
active
07104268
ABSTRACT:
A wafer cleaning method and system including a combined high frequency signal, a low frequency signal, and in one embodiment a biased voltage signal, allows cleaning particles and impurities off of fine-structured wafers, through application of an acoustic field to the wafer through a cleaning liquid which fosters micro-bubble formation for effective cleaning while buffering micro-bubble growth which would otherwise damage the wafer.
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Franklin Cole S.
Fraser Brian
Nicolosi Thomas
Wu Yi
Akrion Technologies, Inc.
Belles Brian L.
Kornakov M.
Wolf Block Schorr & Solis-Cohen LLP
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