Medical device durability test apparatus having an...

Measuring and testing – Simulated environment

Reexamination Certificate

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C623S912000, C623S913000

Reexamination Certificate

active

07621192

ABSTRACT:
Apparatuses and methods for determining particle shed rates of implantable or inter-dwelling devices are disclosed. Durability test apparatuses with integrated particle counters produce time-dependent particle shed rate profiles. The apparatuses are designed to accommodate pulsatile flow, resembling a heartbeat at the implantable device. In an embodiment, the pulsatile flow is converted to a steady flow before fluid enters the integrated particle counter.

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patent: 7254988 (2007-08-01), Keeble
patent: 2003/0066338 (2003-04-01), Michalsky et al.
patent: 2005/0118344 (2005-06-01), Pacetti
patent: 2005/0119720 (2005-06-01), Gale et al.

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