Mechanized loop testing using a local metallic access port

Details Mechanized loop testing using a local metallic access port Mechanized loop testing using a local metallic access port

1984-09-21

1987-02-03

Olms, Douglas W.

Multiplex communications

Wide area network

Packet switching

370 13, 379 29, H04J 116, H04J 314

Patent

active

046412999

ABSTRACT:
In a telephone local exchange system where loops are connected to a remote switch which in turn homes on a host switch via a carrier system and where the distance between the ends of the loops and the host switch exceeds a threshold, the loops may be tested by locating the test apparatus remotely from the host switch so that the distance between the free ends of the loops and the test apparatus is below the threshold and so that a metallic pair of conductors may be used therebetween to permit some tests which cannot be done using carrier facilities. In order to establish a connection between the test apparatus and the loops, signals are transferred over two dedicated carrier channels between the test apparatus and the host switch via two applique circuits. These applique circuits make it appear to the test system as if the remote switch (or carrier RT or concentrator) support a test trunk. This makes it possible to use test hardware designed for use with local exchange offices with these remote units without modification to the test system itself.

REFERENCES:
patent: 3571530 (1971-03-01), Davies
patent: 3980839 (1976-09-01), Hutcheson
patent: 4112264 (1978-09-01), Abramson et al.
patent: 4258236 (1981-03-01), Conklin et al.
patent: 4424421 (1984-01-01), Townsend et al.

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