Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system
Reexamination Certificate
2006-07-04
2006-07-04
Jones, Hugh (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating nonelectrical device or system
C703S017000, C716S030000
Reexamination Certificate
active
07072813
ABSTRACT:
In system design simulators, probes are software objects that collect data from simulated system components. A probe synchronization method and device are used to collect simulation data from the components during a period of interest. For example, a given event that occurs during the simulation may signal the beginning of the period, and another event may signal the end of the period. An acquisition window having a starting point and an ending point coinciding with the occurrence of the events may be used by a probe master to cause one or more probes to collect data during this period of interest. A unique Identifier or Tag of this period of interest is generated by the Probe Master and sent to all the slave probes. This Tag is dumped in the simulation database. It allows post-processing correlations between high-level simulation events and low-level model reactions.
REFERENCES:
Choy et al.; Test generation with dynamic probe points in high observability testing environment; pp. 88-96; IEEE Trans. Computers; Jan. 1996.
DeRose et al.; The dynamic probe class library-an infrastructure for developing instrumentation for performance tools; 7 pages; IEEE Proc. 15thInter. Parallel and distributed rpocessing symp.; Apr. 2001.
Billemaz Marc
Bornat Pascal
Brunel Jean-Yves
Bingham & McCutchen LLP
Cadence Design Systems Inc.
Jones Hugh
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