Mechanism for determining an accelerated test specification...

Details Mechanism for determining an accelerated test specification... Mechanism for determining an accelerated test specification...

2006-06-28

2009-08-04

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

Reexamination Certificate

active

07571059

ABSTRACT:
A mechanism is disclosed for determining an accelerated test for a device. The method comprises calculating an estimated amount of damage that an element of the device would suffer if the device were operated under a set of specified conditions over a certain period of time (e.g., expected lifetime of the device). The method further comprises determining an accelerated test to which to subject the element in order to cause the element to suffer an actual amount of damage that is approximately equal to the estimated amount of damage. The accelerated test may be an accelerated test cycle, such as an accelerated temperature cycle.

REFERENCES:
patent: 6678627 (2004-01-01), Starr
patent: 7283932 (2007-10-01), Olsson
patent: 2006/0260639 (2006-11-01), Fani et al.

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