Mechanically-coupled tuning fork-scanning probe vibrating...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes

Reexamination Certificate

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Details

C850S038000

Reexamination Certificate

active

08087093

ABSTRACT:
Provided is a mechanically-coupled tuning fork-scanning probe vibrating system, the system including: a tuning fork vibrating due to an AC voltage applied thereto; a scanning probe attached to a side of the tuning fork and vibrating due to the tuning fork; and a contact member contacting a side surface of the scanning probe and adjusting a position of a contact point at which the contact member contacts with the scanning probe, to vary a natural frequency of a combination body in which the tuning fork and the scanning probe are combined with each other. A natural frequency of the mechanically-coupled tuning fork-scanning probe vibrating system is closer to a natural frequency of the tuning fork itself by using a dynamic vibration control method using a contact member so that a energy loss of the mechanically-coupled tuning fork-scanning probe vibrating system can be minimized, a quality factor of the mechanically-coupled tuning fork-scanning probe vibrating system can be maximized, the quality factor can be actively controlled regardless of an environment of a specimen to be detected and both a specimen in air and a specimen in a liquid medium with high viscosity can be detected with high resolution.

REFERENCES:
patent: 6075585 (2000-06-01), Minne et al.
patent: 6201227 (2001-03-01), Tomita
patent: 6257053 (2001-07-01), Tomita et al.
Morville, J. Liu, A. Callegari, and M. Chergui, “Q-factor optimization of a tuning-fork/fiber sensor for shear-force detection,” Appl. Phys. Lett. 86, 064103 (2005).

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