Mechanical sensors of electromagnetic fields

Details Mechanical sensors of electromagnetic fields Mechanical sensors of electromagnetic fields

2002-04-12

2004-12-28

Luu, Thanh X. (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

C250S225000

Reexamination Certificate

active

06835926

ABSTRACT:

BACKGROUND
This application relates to mechanical sensors for sensing electromagnetic fields.
A material with an electromagnetic polarization can interact with a radiation field and may move, e.g., oscillate around an equilibrium position, due to the interaction. The movement of the material may be measured or monitored for a variety of applications including, among others, imaging and spectroscopy. In particular, this force-induced motion caused by electromagnetic interaction may be used to provide non-destructive measurements with high spatial resolution and high detection sensitivity. Examples of this type of devices include the scanning tunneling microscope, atomic force microscope, and near-field scanning optical microscope.
SUMMARY
This application includes sensing devices and techniques based on motion of a mechanical oscillator caused by electromagnetic interaction, such as a magnetic polarization with a magnetic field or an electric polarization with an electric field. Such devices may be used to detect or measure an electromagnetic field such as a RF signal or to detect or measure a sample which may have an inherent polarization or may be polarized in an external electromagnetic field.


REFERENCES:
patent: 5623205 (1997-04-01), Tomita et al.
patent: 5998995 (1999-12-01), Osiander et al.
patent: 6000280 (1999-12-01), Miller et al.
patent: 6314800 (2001-11-01), Nishimura
patent: 6497141 (2002-12-01), Turner et al.
Zenhausern et al.,Apertureless near-field optical microscopeApplied Physics Letter, 1994, vol. 65, No. 13, pp. 1623-1625.
Hamann et al.,Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution, Applied Physics Letters, 1998, vol. 73, No. 11, pp. 1469-1471.
Wickermansinghe et al.Progress in scanning probe microscopyActa Mater., 2000, vol. 48 No. 1, pp. 347-358.
Averbukh et al.,Coherent near field optical microscopy, Optics Communications, 2000, vol. 174, No. 1-4, pp. 33-41.
Novotny et al.,Theory of nanometric optical tweezers, Physics Review Letters, 1997, vol. 79, No. 4, pp. 645-648.

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