Mechanical property measurement of thin films by micro...

Details Mechanical property measurement of thin films by micro... Mechanical property measurement of thin films by micro...

2008-07-08

2008-07-08

Lefkowitz, Edward (Department: 2855)

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

C073S790000, C073S791000, C073S795000

Reexamination Certificate

active

07395722

ABSTRACT:
This invention is directed to the measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width. This invention is further directed to the measurement of stress-strain relationships in thin films at controlled temperatures and at high strain rates above 100% per second.

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