Mechanical force detection of magnetic fields using...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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C702S065000

Reexamination Certificate

active

07146282

ABSTRACT:
Localized magnetic fields are measured at frequencies into the microwave (GHz) regime using a conductive loop that is integrated on a vibratable member, such as a cantilever. Driving an alternating current at a first high frequency through the loop produces a high frequency alternating magnetic dipole at the same frequency as the current, with the alternating magnetic dipole normal to and centered within the loop. The alternating magnetic dipole at the center of the loop mixes with a sampled alternating magnetic field at a second high frequency at the center of the loop, resulting in application of a mechanical force to the loop and vibratable member. The vibratable member vibrates when the difference between the frequency of the loop current and the frequency of the sampled alternating magnetic field equals the resonant frequency of the vibratable member.

REFERENCES:
patent: 5166615 (1992-11-01), Sidles
patent: 5266896 (1993-11-01), Rugar et al.
patent: 5465046 (1995-11-01), Campbell et al.
patent: 5900728 (1999-05-01), Moser et al.
patent: 5936237 (1999-08-01), Van der Weide
patent: 5983712 (1999-11-01), Lindsay et al.
patent: 6181131 (2001-01-01), Bruland et al.
patent: 6668627 (2003-12-01), Lange et al.
patent: 6862923 (2005-03-01), Buguin et al.
A.S. Hou, F. Ko and D.M. Bloom, “Pipcosecond Electrial Sampling Using a Scanning Force Microscope”, Electronics Letters, vol. 28, No. 25, pp. 2302-2303, Dec. 3, 1992.
G. E. Bridges, R. A. Said, and D. J. Thompson, “Heterodyne Electrostatic Force Microscopy for Non-Contact High Frequency Integrated Circuit Measurement”, Electronics Letters, vol. 29, No. 16, pp. 1448-1449, Aug. 5, 1993.
F. Ho, A.S. Hou, and D. M. Bloom, “High-Speed Integrated Circuit Probing Using a Scanning Force Microscope Sampler”, Electronics Letters, vol. 30, No. 7, pp. 560-562, Mar. 31, 1994.
Louis A. Madsen, “Force-Detected NMR in a Homogeneous Field: Experiment Design, Apparatus, and Observations”, Thesis for California Institute of Technology, Pasadena, CA, Feb. 19, 2002.

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