Measuring tool for computer assisted tomographic scanner

Details Measuring tool for computer assisted tomographic scanner Measuring tool for computer assisted tomographic scanner

1980-04-14

1982-08-10

Smith, Alfred E.

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

378 19, 378163, G01D 1800

Patent

active

043441831

ABSTRACT:
A measuring tool (10) for determining the thickness and position of the X-ray beam of a computer is disclosed which allows the information about the X-ray beam to be derived by analysis of a tomographic image taken of the measuring tool. The measuring tool (10) includes a phantom (12) which has formed therein a plurality of receptacles (14) which receive inserts (16). At least two of the inserts (16) each include therein an image creating pattern (20) including a helical pattern (22) and a center indicator (24) so that both thickness and positioning information can be obtained from the computer-generated tomographic image taken of the tool by examining the images created of the helical patterns (22) and center indicators (24) in the inserts (16).

REFERENCES:
patent: 3509337 (1970-04-01), De Clerk et al.
patent: 3887804 (1975-06-01), Morgan et al.
patent: 4055771 (1977-10-01), Goodenough
"Wisconsin Tomographic Test Tool", trade brochure, Radiation Measurements, Inc., 7617 Donna Drive, P.O. Box 44, Middleton, WI 53562, 1977.

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