Measuring threshold voltage of transistors in a circuit

Details Measuring threshold voltage of transistors in a circuit Measuring threshold voltage of transistors in a circuit

2007-02-23

2008-12-30

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07471102

ABSTRACT:
In one embodiment, the present invention includes an oscillator to generate a first frequency and a second frequency. The oscillator includes a plurality of stage cells, each stage cell including a first transistor of a first polarity and a second transistor of a second polarity, each coupled between a first voltage node and a first intermediate node and an inverter coupled to the first intermediate node. In operation, a difference between the first frequency and the second frequency is proportional to a threshold voltage of the second transistor. Other embodiments are described and claimed.

REFERENCES:
patent: 4513258 (1985-04-01), Jamiolkowski et al.
patent: 7323908 (2008-01-01), Chuang et al.

Affiliated with

Also associated with

Rating

Measuring threshold voltage of transistors in a circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring threshold voltage of transistors in a circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring threshold voltage of transistors in a circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4024450